Share Email Print
cover

Proceedings Paper

3D measurement of human face by stereophotogrammetry
Author(s): Holger Wagner; Axel Wiegmann; Richard Kowarschik; Friedrich Zollner
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

At present several methods are adapted for the optical characterization of 3D surface profiles and forms, which are based on fringe projection, moire techniques, gray-code projection or photogrammetry [1-5]. According to principle and application the methods differ in accuracy of measurement as well as computation time or their technical complexity. Photogrammetry is a well-adapted method for the measurement of 3D objects. The basic idea of the method is to get the whole 3D matrix of real objects by capturing a number of 2D images. In this work we show a possibility for a rapid measurement (< 1 second) of the shape of a human face for medical applications (e. g. jaw-measurement). The surface structure of the human face is too homogenous to find homologous points by an ordinary illumination; therefore about 20 special statistical patterns are projected on the face and taken by cameras of a convergent stereo system. At present a digital projector is used but it is also possible to generate the statistical patterns by a classical one. To find the corresponding points in the pictures we use an enhanced correlation technique, which takes into account the characteristic intensity sequence of every single sensor element - unlike other correlation techniques, which avail a pixel area as a template. The influence of distortion - caused by the surface profile - is kept to a minimum. Therefore at higher profile gradients a denser point cloud is generated. At present the reachable accuracy is +/- 0.1mm (rms), which is sufficient for medical and other applications. But the demonstrated method is not restricted to evaluate the shape of human faces. Also technical objects could be measured.

Paper Details

Date Published: 13 June 2005
PDF: 8 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612225
Show Author Affiliations
Holger Wagner, Friedrich Schiller Univ. Jena (Germany)
Axel Wiegmann, Friedrich Schiller Univ. Jena (Germany)
Richard Kowarschik, Friedrich Schiller Univ. Jena (Germany)
Friedrich Zollner, Friedrich Schiller Univ. Jena (Germany)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top