Share Email Print
cover

Proceedings Paper

Phase evaluation using interference of polychromatic light and colorimetric analysis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Measurements of very small phase changes in optical measurement techniques are usually performed by interferometric methods that are based on evaluation of interference patterns, which correspond to a phase change of the investigated wave field. If values of the phase change are small, it is difficult to determine accurately the phase values, and one needs very expensive measurement systems. Our work presents a simple method for evaluation of small phase variations that uses the interference of polychromatic light. The phase change affects the color of the interference pattern, and color of the interference pattern corresponds to a specific phase change that can be evaluated using colorimetric analysis. We describe and analyse the colorimetric phase evaluation method in our work. The proposed method offers accurate results and it is suitable for practical utilization in optical industry.

Paper Details

Date Published: 13 June 2005
PDF: 11 pages
Proc. SPIE 5856, Optical Measurement Systems for Industrial Inspection IV, (13 June 2005); doi: 10.1117/12.612016
Show Author Affiliations
Pavel Novak, Czech Technical Univ. (Czech Republic)
Jiri Novak, Czech Technical Univ. (Czech Republic)
Antonin Miks, Czech Technical Univ. (Czech Republic)


Published in SPIE Proceedings Vol. 5856:
Optical Measurement Systems for Industrial Inspection IV
Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Editor(s)

© SPIE. Terms of Use
Back to Top