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Proceedings Paper

Uncertainty evaluation of displacements measured by ESPI with divergent wavefronts
Author(s): Amalia Martinez; Raul Cordero; Juan A. Rayas; Hugo J. Puga; Ramon Rodriguez-Vera
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Paper Abstract

Displacement measurements by optical interferometry are affected by errors in the determination of the phase-difference and in interferometer sensitivity. In this paper, we perform an uncertainty analysis of displacements measured by in-plane ESPI with spherical wavefronts. The displacements were induced by applying uniaxial tensile load on a nominally flat elastic sample. Our attention was focused on the quantification of the effect of eventual errors in the sensitivity vector determination. We found that the displacement uncertainty depends on the geometry of the optical arrangement, and on the dimensions of the illuminated field. Moreover, the displacement uncertainty increases with the deformation.

Paper Details

Date Published: 14 February 2005
PDF: 11 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611903
Show Author Affiliations
Amalia Martinez, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Raul Cordero, Pontificia Univ. Catolica de Chile (Chile)
Escuela Superior Politecnica del Litoral (Ecuador)
Juan A. Rayas, Ctr. de Investigaciones en Optica, A.C. (Mexico)
Hugo J. Puga, Instituto Tecnologico de Leon (Mexico)
Ramon Rodriguez-Vera, Ctr. de Investigaciones en Optica, A.C. (Mexico)

Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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