Share Email Print

Proceedings Paper

3D optical measuring technologies and systems
Author(s): Yuri V. Chugui
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The results of the R & D activity of TDI SIE SB RAS in the field of the 3D optical measuring technologies and systems for noncontact 3D optical dimensional inspection applied to atomic and railway industry safety problems are presented. This activity includes investigations of diffraction phenomena on some 3D objects, using the original constructive calculation method. The efficient algorithms for precise determining the transverse and longitudinal sizes of 3D objects of constant thickness by diffraction method, peculiarities on formation of the shadow and images of the typical elements of the extended objects were suggested. Ensuring the safety of nuclear reactors and running trains as well as their high exploitation reliability requires a 100% noncontact precise inspection of geometrical parameters of their components. To solve this problem we have developed methods and produced the technical vision measuring systems LMM, CONTROL, PROFIL, and technologies for noncontact 3D dimensional inspection of grid spacers and fuel elements for the nuclear reactor VVER-1000 and VVER-440, as well as automatic laser diagnostic COMPLEX for noncontact inspection of geometric parameters of running freight car wheel pairs. The performances of these systems and the results of industrial testing are presented and discussed. The created devices are in pilot operation at Atomic and Railway Companies.

Paper Details

Date Published: 14 February 2005
PDF: 13 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611832
Show Author Affiliations
Yuri V. Chugui, Technological Design Institute of Scientific Instrument Engineering, RAS (Russia)

Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

© SPIE. Terms of Use
Back to Top