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Proceedings Paper

Analysis of dental materials by photothermal radiometry
Author(s): M. Conde-Contreras; V. Tiessler; A. Cucina; P. Quintana; Juan Jose Alvarado-Gil
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Paper Abstract

The analysis of teeth is an interesting field, given the importance of these pieces for the individual or for humanity in the case of remains recovered from an archeologically site; therefore, the development of non-destructive techniques is important to study these materials. Photothermal techniques are ones of the most interesting possibilities; they are based in the generation of a train of thermal waves inside of a material due to the illumination with modulated light. Among these techniques photothermal radiometry has an outstanding role, since it is a non-contact technique, based in the detection of infrared emission of the samples heated with the laser. The experimental configuration consists of an Ar laser beam that impinges on the surface of the teeth and the infrared radiation generated is measured using a HgCdTe IR detector. Results for the analysis of cracks on teeth and the low frequency profiles are presented. A strong influence of the signal due to the microstructure of teeth is observed. Furthermore, surface effects are analyzed changing the color of teeth when whitening products are applied. The process of whitening is monitored in real time by optical spectroscopy in the visible and by photothermal radiometry.

Paper Details

Date Published: 14 February 2005
PDF: 9 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611776
Show Author Affiliations
M. Conde-Contreras, Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico)
V. Tiessler, Univ. Autonoma de Yucatan (Mexico)
A. Cucina, Univ. Autonoma de Yucatan (Mexico)
P. Quintana, Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico)
Juan Jose Alvarado-Gil, Ctr. de Investigacion y de Estudios Avanzados del IPN (Mexico)


Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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