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Proceedings Paper

Multispectral phase-crossing white-light interferometry
Author(s): Michal Emanuel Pawlowski; Youhei Sakano; Yoko Miyamoto; Mitsuo Takeda
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Paper Abstract

A new method of white-light fringes analysis called multi-spectral phase-crossing detection is presented. The technique is based on analysis of phase distributions of at least two white-light interferograms recorded simultaneously by detectors with mutually different spectral sensitivities. The analysis of the phase crossing of multiple white-light interferograms with different spectral bands gives us the possibility to find the position of zero optical path difference without ambiguity. The theoretical background and measurement results are presented.

Paper Details

Date Published: 14 February 2005
PDF: 6 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611644
Show Author Affiliations
Michal Emanuel Pawlowski, Univ. of Electro-Communications (Japan)
Youhei Sakano, Univ. of Electro-Communications (Japan)
Yoko Miyamoto, Univ. of Electro-Communications (Japan)
Mitsuo Takeda, Univ. of Electro-Communications (Japan)


Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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