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Proceedings Paper

Hybrid JTC using DSP technology
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Paper Abstract

In this work we implemented a hybrid joint Fourier transform correlator (JTC optical/electronic) helpful in the pattern recognition when the scene is in movement. We have been use the standard architecture JTC, but in our case, the first step of the correlation process is carried out optically, using coherent illumination to obtain the joint power spectrum (JPS) of each frame display on a spatial light modulator, we used a liquid crystal display CRL XGA4 with 1024 x 768 pixels of resolution in gray scale. It display a video sequence where is include a mobile scene and the reference, then, the JPS of each frame will be obtain in real time with the quadratic sensor (camera CCD) that is located in the back focal plane of the lens. For the second step was use the tools of the Imaging Developer Kit TMS3206711 DSP (IDK) of Texas Instruments, in order to take advantage of the high speed arithmetic offers by the Digital Signal Proccessor (DSP) and the electronics versatility offers to take decisions. The IDK is a tool of hardware and software that allows capture, process and display images in real time. The DSP microprocessor makes a Fourier transform of the image captured by the CCD, in this way, we obtain the correlation of the scene in movement in quasi real time. Using an efficient computation of the digital Fourier transform of a 2N-point real sequence, the hybrid correlator achieve 15 correlations per second, if the final result is display on the monitor the rate fall to 13 frames per second, the correlation peak was use to determine in real time the target position in the mobile scene.

Paper Details

Date Published: 14 February 2005
PDF: 7 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611642
Show Author Affiliations
Joaquin Cornejo, Univ. Industrial de Santander (Colombia)
Yezid Torres, Univ. Industrial de Santander (Colombia)


Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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