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Proceedings Paper

Accurate and highly resolving quadri-wave lateral shearing interferometer, from visible to IR
Author(s): Sabrina Velghe; Jerome Primot; Nicolas Guerineau; Riad Haidar; Mathieu Cohen; Benoit Wattellier
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Paper Abstract

A powerful and achromatic interferometric technique based on recent advances in the technology of non-diffracting arrays is used to evaluate wave-front distortions with a high transverse resolution and an easily tunable dynamic range. The device presented here belongs to the family of Multiple Wave Lateral Shearing Interferometers (MWLSI) and has the natural capability to measure simultaneously four wave-front derivatives. In this communication, we propose to exploit all the information de facto included in the interferogram; in this perspective we suggest a new method of reconstruction of the wave-front knowing its derivatives. We will show that our device is already successful in the field of laser metrology in the near infrared domain and that it is promising for the far infrared domain with the presentation of a prototype dedicated to measurements at 10.6µm.

Paper Details

Date Published: 14 February 2005
PDF: 10 pages
Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); doi: 10.1117/12.611606
Show Author Affiliations
Sabrina Velghe, ONERA (France)
Jerome Primot, ONERA (France)
Nicolas Guerineau, ONERA (France)
Riad Haidar, ONERA (France)
Mathieu Cohen, PHASICS S.A. (France)
Benoit Wattellier, PHASICS S.A. (France)


Published in SPIE Proceedings Vol. 5776:
Eighth International Symposium on Laser Metrology
R. Rodriguez-Vera; F. Mendoza-Santoyo, Editor(s)

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