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Proceedings Paper

Measurement of spatial-frequency and amplitude characteristics of a device for laser beam quality characterization
Author(s): Alexander N. Starodub; Vyacheslav P. Kirillov; Andrey V. Kutsenko; Yury A. Mikhailov; Gleb V. Sklizkov; Oleg A. Sudakov; Kirill A. Zhurovich
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Paper Abstract

A unique method has been developed for studying spatial-frequency and amplitude characteristics of an image registration device on the basis of a CCD-matrix. A monochromatic light intensity distribution arising from Fraunhofer diffraction on two equal slits is used as an input signal.

Paper Details

Date Published: 23 March 2005
PDF: 4 pages
Proc. SPIE 5777, XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers, (23 March 2005); doi: 10.1117/12.611253
Show Author Affiliations
Alexander N. Starodub, P.N. Lebedev Physical Institute (Russia)
Vyacheslav P. Kirillov, Moscow Institute of Physics and Technology (Russia)
Andrey V. Kutsenko, P.N. Lebedev Physical Institute (Russia)
Yury A. Mikhailov, P.N. Lebedev Physical Institute (Russia)
Gleb V. Sklizkov, P.N. Lebedev Physical Institute (Russia)
Oleg A. Sudakov, Moscow Institute of Physics and Technology (Russia)
Kirill A. Zhurovich, P.N. Lebedev Physical Institute (Russia)


Published in SPIE Proceedings Vol. 5777:
XV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers
Jarmila Kodymova, Editor(s)

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