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Proceedings Paper

Radiation hardening of ASICs in deep submicron CMOS technologies
Author(s): Robert Szczygiel
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Paper Abstract

The radiation hardness is a critical issue for a number of ASIC applications. The ASICs used in space, physics experiments or in medical instrumentations have to deal with the radiation and its effects. The paper gives a short overview of the radiation-induced effects in the CMOS devices and presents design and system aspects of the ASIC radiation hardening. Examples of chips designed for heavy radiation environment are presented.

Paper Details

Date Published: 23 February 2005
PDF: 8 pages
Proc. SPIE 5775, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments III, (23 February 2005); doi: 10.1117/12.610622
Show Author Affiliations
Robert Szczygiel, Institute of Nuclear Physics (Poland)


Published in SPIE Proceedings Vol. 5775:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments III
Ryszard S. Romaniuk, Editor(s)

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