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Proceedings Paper

Application of the scattering screen for the automated measurements of spatial-power characterstics of radiation of semiconductor lasers
Author(s): A. V. Grishanov; V. N. Grishanov
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Paper Abstract

In the given article the use of scattering screens is offered as intermediate sourcs of radiation at measurements of spatial-power parameters wide-aperture optical bunches. It is shown, that in bidimensional statement of a problem, the reduction from experimental values of distribution of a radiation stream to angular distribution of power force of light is possible at the set angular dependence of factor diffusive transmission or reflections of the scattering screen and known geometric-optical parameters of measuring unit.

Paper Details

Date Published: 16 February 2005
PDF: 9 pages
Proc. SPIE 5447, Lasers for Measurements and Information Transfer 2004, 54470K (16 February 2005); doi: 10.1117/12.610580
Show Author Affiliations
A. V. Grishanov, Samara State Aerospace Univ. (Russia)
V. N. Grishanov, Samara State Aerospace Univ. (Russia)


Published in SPIE Proceedings Vol. 5447:
Lasers for Measurements and Information Transfer 2004
Vadim E. Privalov, Editor(s)

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