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Proceedings Paper

Noise in carbon nanotube electronics
Author(s): Derek Kingrey; Philip G. Collins
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Paper Abstract

A variety of noise measurements have been accomplished on electronic devices incorporating individual single-walled carbon nanotubes. Noise with a 1/f frequency dependence and noise attributed to two-level fluctuators are independently measured, even when these two components occur simultaneously in the same device. We demonstrate the importance of isolating these two components before attempting quantitative analysis, and then proceed to characterize devices as a function of temperature and processing history. High temperature desorption, surface passivation with polymer, and encapsulation in SiO2 films followed by forming gas annealing are three different process pathways which failed to substantially decrease the noise in these devices. In all of the devices measured, the 1/f noise components are found to only weakly decrease with temperature and to be practically independent of processing history. The two-level fluctuators, on the other hand, appear to be thermally activated and their contribution to the total noise typically increases with different processing steps.

Paper Details

Date Published: 23 May 2005
PDF: 9 pages
Proc. SPIE 5846, Noise and Information in Nanoelectronics, Sensors, and Standards III, (23 May 2005); doi: 10.1117/12.609278
Show Author Affiliations
Derek Kingrey, Univ. of California/Irvine (United States)
Philip G. Collins, Univ. of California/Irvine (United States)


Published in SPIE Proceedings Vol. 5846:
Noise and Information in Nanoelectronics, Sensors, and Standards III
Janos A. Bergou; Janusz M. Smulko; Mark I. Dykman; Lijun Wang, Editor(s)

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