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Proceedings Paper

Optically pumped mid infrared emitters built using surface structured PbSe epitaxial layers
Author(s): J. Nurnus; U. Vetter; J. Koenig; R. Glatthaar; A. Lambrecht; F. Weik; J. W. Tomm
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Paper Abstract

Light emitting devices for the infrared spectral region are used in a lot of application fields. In the mid infrared (MIR) region, where a lot of gases show strong absorptions, the optical output power of inexpensive emitters in the relevant wavelength range is too low. An optically pumped emitter for the MIR region around 4 μm based on narrow gap semiconductors is demonstrated. The pumping takes place using inexpensive near-infrared (around 1 μm) high power continuous wave (cw) semiconductors laser. The radiation is converted by the narrow gap semiconductor into the MIR region as spontaneous emission. Molecular beam epitaxy (MBE) grown IV-VI lead chalcogenide-based compounds, especially PbSe, are applied for frequency conversion. The structural and optical quality of these thin film materials is characterized mainly by X-ray defraction measurements (XRD) and photo luminescence (PL) spectroscopy. For high radiation efficiency the outcoupling of the light is enhanced by surface structuring. Useful structures generating high photoluminescence intensity are characterized by IR imaging with an IR camera system being sensitive in the spectral region of interest. Due to the high pumping powers the device design-especially the thermal management of the active PbSe film-plays an important role. We will present a preparation technique for optically pumped, surface structured PbSe emitters in transmission geometry exploiting the transparency of the substrates and glues in the relevant wavelength region. The measured total emission power of the emitters exceeds 0.5 mW. Using an optimised design total emission powers up to 2 mW were achieved.

Paper Details

Date Published: 7 July 2005
PDF: 9 pages
Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); doi: 10.1117/12.608779
Show Author Affiliations
J. Nurnus, Fraunhofer Institut fur Physikalische Messtechnik (Germany)
U. Vetter, Fraunhofer Institut fur Physikalische Messtechnik (Germany)
J. Koenig, Fraunhofer Institut fur Physikalische Messtechnik (Germany)
R. Glatthaar, Fraunhofer Institut fur Physikalische Messtechnik (Germany)
A. Lambrecht, Fraunhofer Institut fur Physikalische Messtechnik (Germany)
F. Weik, Max-Born-Institut fur Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
J. W. Tomm, Max-Born-Institut fur Nichtlineare Optik und Kurzzeitspektroskopie (Germany)

Published in SPIE Proceedings Vol. 5840:
Photonic Materials, Devices, and Applications
Goncal Badenes; Derek Abbott; Ali Serpenguzel, Editor(s)

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