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Proceedings Paper

The influence of light on the gas sensitive properties of microstructured metal oxide thin films
Author(s): E. Moretton; J. Hildenbrand; A. Lambrecht; J. Wollenstein
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Paper Abstract

Metal oxide gas sensors are widely used for different applications and operate normally at high temperatures between 300°C and 600°C. Such high temperatures are mainly needed to speed up the desorption of molecules from the gas sensor surface. Goal of the reported investigations is the reduction of the operating temperatures of such devices by the influence of radiation on the gas adsorption/desorption process. Therefore, the influences of radiation on the gas sensing mechanisms at surfaces of different metal oxides (SnO2, ZnO, WO3 and Cr2-xTixO3+z) have been studied for different wavelengths. The experiments were carried out at an operating temperature of 130°C as well as at room temperature. As radiation sources LEDs emitting at different wavelength were used. The sensor response to NO2, CO, NH3 and H2 has been measured with and without illumination. The investigations have shown that light mainly influences the photo-activation of electron-hole pairs, which results in an increasing of the electrical conductivity of the illuminated metal oxide. The observed influences of photoadsorption and photocatalytic effects are small compared to the photoelectric effect. Only a weak increase of the NO2 sensitivity during illumination has been measured.

Paper Details

Date Published: 1 July 2005
PDF: 7 pages
Proc. SPIE 5836, Smart Sensors, Actuators, and MEMS II, (1 July 2005); doi: 10.1117/12.608599
Show Author Affiliations
E. Moretton, Fraunhofer Institute for Physical Measurement Techniques (Germany)
J. Hildenbrand, Fraunhofer Institute for Physical Measurement Techniques (Germany)
A. Lambrecht, Fraunhofer Institute for Physical Measurement Techniques (Germany)
J. Wollenstein, Fraunhofer Institute for Physical Measurement Techniques (Germany)


Published in SPIE Proceedings Vol. 5836:
Smart Sensors, Actuators, and MEMS II
Carles Cane; Jung-Chih Chiao; Fernando Vidal Verdu, Editor(s)

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