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Proceedings Paper

A novel technique for low-cost testing of low-noise amplifiers
Author(s): Gerard Baldwin; Ronan J. Farrell
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Proc. SPIE 5837, VLSI Circuits and Systems II, ; doi: 10.1117/12.608484
Show Author Affiliations
Gerard Baldwin, National Univ. of Ireland/Maynooth (Ireland)
Ronan J. Farrell, National Univ. of Ireland/Maynooth (Ireland)


Published in SPIE Proceedings Vol. 5837:
VLSI Circuits and Systems II
Jose Fco. Lopez; Francisco V. Fernandez; Jose Maria Lopez-Villegas; Jose M. de la Rosa, Editor(s)

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