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Proceedings Paper

Study of the proximity effect in high q inductors for wireless LAN (WLAN)
Author(s): I. Cendoya; J. Mendizabal; N. Sainz; I. Gutierrez; U. Alvarado; J. de No
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Paper Abstract

The quality factor (Q) measures the ability of a component to preserve the energy received during the circuit operation. Q is the most important parameter in an inductor. It is mainly limited by the loss due to inductor metal resistance, substrate resistance, and the resistance associated with induced Eddy current below the inductor metal trace. One of the pernicious effects for the Q of an inductor is the proximity effect. Proximity effect is caused by the magnetic field generated by the own inductor and induces parasitic currents in the metal tracks causing an increase in the resistance and thus diminishing the Q. The objective of this paper is to study this effect and consequently to obtain some inductor design rules, which allow the designer to implement high quality inductors. This paper is focused on balanced inductors for a WLAN application using CMOS 0.18 μm technology.

Paper Details

Date Published: 30 June 2005
PDF: 7 pages
Proc. SPIE 5837, VLSI Circuits and Systems II, (30 June 2005); doi: 10.1117/12.608358
Show Author Affiliations
I. Cendoya, Univ. de Navarra (Spain)
J. Mendizabal, Ctr. de Estudios e Investigaciones Tecnicas de Guipuzcoa (Spain)
N. Sainz, Univ. de Navarra (Spain)
I. Gutierrez, Univ. de Navarra (Spain)
U. Alvarado, Ctr. de Estudios e Investigaciones Tecnicas de Guipuzcoa (Spain)
J. de No, Univ. de Navarra (Spain)


Published in SPIE Proceedings Vol. 5837:
VLSI Circuits and Systems II
Jose Fco. Lopez; Francisco V. Fernandez; Jose Maria Lopez-Villegas; Jose M. de la Rosa, Editor(s)

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