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Proceedings Paper

Preparation and performance of phase retarder at the wavelength of 1315 nm
Author(s): Jianbing Huang; Jianda Shao; Yingjian Wang; Zhengxiu Fan
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Paper Abstract

The periodic dielectric phase retarders that produce a ±90° phase shift between the p- and s- polarization components at the incident angle of 54° and the wavelength of 1315nm while maintaining high reflectivity for both components are designed. An optimization technique has been used to determine the layer thickness for a coating design that produce a 270±1° phase shift between the p- and s- polarization components over 1285-1345nm while the average reflectivity is over 99.5%. Then the designed retarders were prepared by ion beam sputtering (IBS), and the phase shift was 262.4±1.8° and the reflectivity was over 99.6% at the design waveband.

Paper Details

Date Published: 8 December 2004
PDF: 4 pages
Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.608009
Show Author Affiliations
Jianbing Huang, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Yingjian Wang, Shanghai Institute of Optics and Fine Mechanics, CAS (China)
Zhengxiu Fan, Shanghai Institute of Optics and Fine Mechanics, CAS (China)


Published in SPIE Proceedings Vol. 5774:
Fifth International Conference on Thin Film Physics and Applications
Junhao Chu; Zongsheng Lai; Lianwei Wang; Shaohui Xu, Editor(s)

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