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Proceedings Paper

Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy
Author(s): Stephen Olson; Balasubramanian Sankaran; Bruce Altemus; Bai Xu; Robert Geer
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Paper Abstract

Although the conventional optical lever technology typically used for scanning probe microscope applications has proven highly sensitive, accurate, and cost effective for most applications involving micromachined cantilever deflection measurements, frequency limitations and space needs limit its applicability to emerging ultrasonic-based SPM applications. Recently, the fabrication of cantilevers integrated with actuation and sensing components has opened avenues for feedback-based driving of micromachined cantilevers at higher-order resonance frequencies while sensing average deflection without the need for an optical deflection pathway for average deflection sensing. The work presented here will review recent efforts by our group in fabricating micromachined cantilevers with integrated piezoresistive deflection-sensing components combined with integrated ZnO actuation layers to induce cantilever deflection. These cantilevers are being fabricated for use in a heterodyne force microscopy system (HFM) to enable SPM imaging contrast based on viscoelastic response of a surface in contact with a micromachined tip wherein active-feedback technology is being applied to maintain ultrasonic tip excitation at higher order cantilever resonances. The first and second-pass fabrication results will be presented and reviewed regarding cantilever release and ZnO actuator (and electrode) fabrication. Dynamic response data from these structures, measured via laser Doppler vibrometery reveal the expected resonance structure for a cantilever of these dimensions.

Paper Details

Date Published: 9 May 2005
PDF: 9 pages
Proc. SPIE 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III, (9 May 2005); doi: 10.1117/12.607770
Show Author Affiliations
Stephen Olson, Univ. at Albany/SUNY (United States)
Balasubramanian Sankaran, Univ. at Albany/SUNY (United States)
Bruce Altemus, Univ. at Albany/SUNY (United States)
Bai Xu, Univ. at Albany/SUNY (United States)
Robert Geer, Univ. at Albany/SUNY (United States)


Published in SPIE Proceedings Vol. 5766:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
Robert E. Geer; Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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