Share Email Print

Proceedings Paper

Microstructure and properties of sol-gel-derived (La,Sr)CoO3 thin film with compositional fluctuation La/Sr ratio
Author(s): Wei Lu; Ping Zheng; Zhongyan Meng; Wenbiao Wu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Thin films of Lanthanum strontium cobalite [(La1-xSrx)CoO3, LSCO] were directly spin-coated onto SiO2/Si (1 0 0) substrates with compositional fluctuation La/Sr ratio, followed by rapid thermal annealing (RTA). The effects of different La/Sr ratios on the microstructure, surface morphology and electrical properties of the films were examined by X-ray diffraction (XRD), scanning electrical microscopy (SEM) and four probe measurements, respectively. The results indicate that the thin film displays a structure transform from rhombohedral phase to cubic phase around x=0.5, and that the resistivity of the thin film decreases with the increase of La/Sr ratio at the first, then increase slightly. A minimum value of resistivity of LSCO appears at x=0.5. In addition, the effect of the annealing temperature on the electrical properties of La0.5Sr0.5CoO3 films is discussed.

Paper Details

Date Published: 8 December 2004
PDF: 4 pages
Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607621
Show Author Affiliations
Wei Lu, Shanghai Univ. (China)
Ping Zheng, Shanghai Univ. (China)
Zhongyan Meng, Shanghai Univ. (China)
Wenbiao Wu, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 5774:
Fifth International Conference on Thin Film Physics and Applications
Junhao Chu; Zongsheng Lai; Lianwei Wang; Shaohui Xu, Editor(s)

© SPIE. Terms of Use
Back to Top