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Proceedings Paper

MBE growth and magnetoresistance properties of PrSrMnO3 films on NdGaO3(100) substrate
Author(s): P. P. Chen; G. J. Liu; H. Makino; Wei Lu; Takafumi Yao
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Paper Abstract

Pr1-xSrxMnO3 (100) thin films were prepared on NdGaO3 (100) substrate by RF-plasma-assisted molecular beam epitaxy method. The films were characterized by reflection high-energy electron diffraction, atomic force microscope and x-ray diffraction methods, indicating perfect surface smoothness and high crystalline quality. Large low field magnetoresistance effects with strong anisotropic properties of the non-stoichiometric (Pr1-xSrx)yMnO3 films have been observed. These results may be connected with the large A-site deficient in the films.

Paper Details

Date Published: 8 December 2004
PDF: 4 pages
Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607465
Show Author Affiliations
P. P. Chen, Shanghai Institute of Technical Physics, CAS (China)
Tohoku Univ. (China)
G. J. Liu, Tohoku Univ. (Japan)
H. Makino, Tohoku Univ. (Japan)
Wei Lu, Shanghai Institute of Technical Physics, CAS (China)
Takafumi Yao, Tohoku Univ. (Japan)


Published in SPIE Proceedings Vol. 5774:
Fifth International Conference on Thin Film Physics and Applications
Junhao Chu; Zongsheng Lai; Lianwei Wang; Shaohui Xu, Editor(s)

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