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Proceedings Paper

The influence of rapid recurrent thermal annealing on magnetic properties of CoFe-O thin film
Author(s): Yu Shi; Huaiwu Zhang; Yulan Jing; Huaizhong Xing; Xiangdong Jiang
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Paper Abstract

The variation of magnetic properties with a new rapid recurrent thermal annealing (RRTA) were studied in high moment thin film (Co 0.35Fe0.65)99O1. After the rapid recurrent thermal annealing at 450°C for several periods of times, the coercivity as-deposited this thin film decreased from 105 to 3 Oe, and their resistivity was decreased to 70 percent. It is found that the method is more effective than other methods to improve the magnetic and electrical properties of (Co0.35Fe0.65)99O1 thin films.

Paper Details

Date Published: 8 December 2004
PDF: 3 pages
Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607332
Show Author Affiliations
Yu Shi, Univ. of Electronics Science and Technology of China (China)
Huaiwu Zhang, Univ. of Electronics Science and Technology of China (China)
Yulan Jing, Univ. of Electronics Science and Technology of China (China)
Huaizhong Xing, DongHua Univ. (China)
Xiangdong Jiang, Univ. of Electronics Science and Technology of China (China)


Published in SPIE Proceedings Vol. 5774:
Fifth International Conference on Thin Film Physics and Applications

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