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Proceedings Paper

Beyond 3rd generation MCT: SXGA QWIP (Invited Paper)
Author(s): Stewart Crawford; Tracey Skivington; Robert Craig; Andrew Haining; Eric Costard; Eric Belhaire; Philippe Bois
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Paper Abstract

Successful past experience of implementing long wave MCT 1st and 2nd Generation thermal imagers has demonstrated to THALES Optronics that MCT presents difficult challenges when correcting non-uniformity errors caused by rapidly changing detector element gain and offset drifts. These problems become even more demanding when the move is made from long linear arrays to focal plane arrays due to the significantly larger number of detector elements. Relaxation of these demands would make a significant impact on the price/performance trade which inevitably occurs in a camera development. In recognition of the need to offer UK MOD best value, THALES Optronics has initiated a programme to achieve a SXGA resolution camera and is working with UK MOD, over a two year period, to investigate whether an alternative technology can maintain the high resolution required whilst achieving a downward step change in price. The selected technology is 3rd Generation Gallium Arsenide long wave Quantum Well Infra-red Photodiode (QWIP) chosen because initial indications are that drift rates are orders of magnitude slower than MCT. The programme involves studies to determine effects of defect clusters, bimodalism, non-uniformity correction levels and higher than normal operating temperatures on achieving acceptable performance, including logistics, in user scenarios whilst maximising detector yield. Development of demonstrator IR camera hardware (technology readiness level 6/7) based on a THALES Research & Technology QWIP array is also part of the programme.

Paper Details

Date Published: 31 May 2005
PDF: 12 pages
Proc. SPIE 5783, Infrared Technology and Applications XXXI, (31 May 2005); doi: 10.1117/12.606693
Show Author Affiliations
Stewart Crawford, THALES Optronics (United Kingdom)
Tracey Skivington, THALES Optronics (United Kingdom)
Robert Craig, THALES Optronics (United Kingdom)
Andrew Haining, THALES Optronics (United Kingdom)
Eric Costard, THALES Research & Technology (France)
Eric Belhaire, THALES Research & Technology (France)
Philippe Bois, THALES Research & Technology (France)

Published in SPIE Proceedings Vol. 5783:
Infrared Technology and Applications XXXI
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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