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Proceedings Paper

Resistor array performance errors associated with extended targets
Author(s): Richard Bryan Sisko
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Proc. SPIE 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X, ; doi: 10.1117/12.606282
Show Author Affiliations
Richard Bryan Sisko, Aegis Technologies Group, Inc. (United States)


Published in SPIE Proceedings Vol. 5785:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
Robert Lee Murrer, Editor(s)

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