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Proceedings Paper

Nanoscale characterisation by SANS and residual stresses determination by neutron diffraction related to materials and components of technological interest
Author(s): Massimo Rogante; Laszlo Rosta
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Paper Abstract

Neutron techniques, among the other non-destructive diagnostics, are becoming more and more relevant in investigating materials and components of industrial interest. In this paper, Small Angle Neutron Scattering (SANS) for microstructural characterisation-especially related to the nanoscale-and Neutron Diffraction for Residual Stresses (RS) measurements are considered. The basic theoretical aspects and some industrial applications of each technique are described. In particular, RS determination in welding, in extruded specimens and in components for energy industry is reported. SANS measurements concerning materials and components for energy and automotive industry are finally presented.

Paper Details

Date Published: 2 June 2005
PDF: 12 pages
Proc. SPIE 5824, Opto-Ireland 2005: Nanotechnology and Nanophotonics, (2 June 2005); doi: 10.1117/12.606090
Show Author Affiliations
Massimo Rogante, Rogante Engineering Office (Italy)
Laszlo Rosta, Research Institute for Solid State Physics and Optics (Hungary)


Published in SPIE Proceedings Vol. 5824:
Opto-Ireland 2005: Nanotechnology and Nanophotonics
David Kennedy; Werner J. Blau; John Colreavy, Editor(s)

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