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Proceedings Paper

Phase coherence theory for data-mining and analysis: application studies in spectroscopy
Author(s): G. Doyle; N. D. McMillan; F. Murtagh; M. O'Neill; S. Riedel; T. S. Perova; S. Unnikrishnan; R. A. Moore
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Paper Abstract

The paper investigates from the perspective of computer science the phase coherence theory (PCT) and phase coherent data-scatter (PCD-S). These techniques were originally developed for the area of optical tensiographic data mining and analysis but have a more general appplication in data mining. These develoments have recently been augmented with the engineering of a software toolkit called TraceMiner. Although the toolkit was originally devised for tensiography it was developed to perform as a generic data mining and analysis application with PCT, PCD-S and a range of other data mining algorithms implemented. To date the toolkit has been utilised in its main application area, tensiography, but has also been applied to UV-visible spectroscopy. This work presents a critical investigation of the general utility of PCT, PCD-S and the toolkit for data mining and analysis. A new application of PCT and the TraceMiner software toolkit to Raman spectroscopy is presented with discussion of the relevant measures and the information provided by the toolkit. This provides more insight into the generic potential of the techniques for data mining. The analysis performed on theoretical Raman data is augmented with a study of experimental Raman data. Raman spectroscopy is used for composition and fault detecton analysis in semiconductor surfaces. Finally, the utility of the PCT technique in comparison with traditional Raman spectroscopy methods is considered together with some more general applications in the field of imaging and machine vision.

Paper Details

Date Published: 1 June 2005
PDF: 12 pages
Proc. SPIE 5823, Opto-Ireland 2005: Imaging and Vision, (1 June 2005); doi: 10.1117/12.606073
Show Author Affiliations
G. Doyle, Institute of Technology Carlow (Ireland)
N. D. McMillan, Institute of Technology Carlow (Ireland)
F. Murtagh, Univ. of London (United Kingdom)
M. O'Neill, Institute of Technology Carlow (Ireland)
S. Riedel, Institute of Technology Carlow (Ireland)
T. S. Perova, Trinity College Dublin (Ireland)
S. Unnikrishnan, Trinity College Dublin (Ireland)
R. A. Moore, Trinity College Dublin (Ireland)


Published in SPIE Proceedings Vol. 5823:
Opto-Ireland 2005: Imaging and Vision
Fionn D. Murtagh, Editor(s)

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