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Proceedings Paper

Health monitoring using MWM-array and IDED-array sensor networks
Author(s): David Grundy; Andrew Washabaugh; Darrell Schlicker; Ian Shay; Neil Goldfine
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Paper Abstract

This paper describes the use of MWM eddy current array sensor networks and IDED dielectrometer array sensor networks as well as hybrid MWM-IDED sensor networks for monitoring of absolute electrical properties for the purposes of detecting and monitoring damage, usage and precursor states within an Adaptive Damage Tolerance (ADT) framework. We present specific results from MWM-Array fatigue monitoring demonstrations, temperature measurement and dynamic stress monitoring, along with IDED methods for age degradation monitoring. We also describe the use of such sensor networks as part of an ADT framework, as well as for generation of real damage standards (e.g., real cracks without starter notches), and for prognostics model validation.

Paper Details

Date Published: 9 May 2005
PDF: 10 pages
Proc. SPIE 5770, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring, (9 May 2005); doi: 10.1117/12.606069
Show Author Affiliations
David Grundy, JENTEK Sensors, Inc. (United States)
Andrew Washabaugh, JENTEK Sensors, Inc. (United States)
Darrell Schlicker, JENTEK Sensors, Inc. (United States)
Ian Shay, JENTEK Sensors, Inc. (United States)
Neil Goldfine, JENTEK Sensors, Inc. (United States)

Published in SPIE Proceedings Vol. 5770:
Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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