Share Email Print

Proceedings Paper

Comparative micro-indentation and dislocation activity in silicon and CaF2: a model
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The indentation micro-mechanical response of Silicon and CaF2 are studied and compared by using 3D finite element simulation. The effects of elastic anisotropy and crystallographic symmetry on contact profile, indentation modulus, and dislocation nucleation underneath a spherical indenter are investigated.

Paper Details

Date Published: 2 May 2005
PDF: 4 pages
Proc. SPIE 10315, Optifab 2005: Technical Digest, 1031513 (2 May 2005); doi: 10.1117/12.605858
Show Author Affiliations
Qin Zhang, Ctr. for Optics Manufacturing/Univ. of Rochester (United States)
John C. Lambropoulos, Ctr. for Optics Manufacturing/Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 10315:
Optifab 2005: Technical Digest
Robert E. Fischer; Masahide Katsuki; Matthias Pfaff; Kathleen A. Richardson, Editor(s)

© SPIE. Terms of Use
Back to Top