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Proceedings Paper

Scene-based non-uniformity correction for focal plane arrays using a facet model
Author(s): Matthias Voigt; Martin Zarzycki; Dennis H. LeMieux; Visvanathan Ramesh
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Paper Abstract

This paper discusses scene-based estimation of non-uniformity correction (NUC) coefficients for focal-plane array sensors using spatial image neighborhood information (facet model). Several scene-based methods for estimation of non-uniformity correction (NUC) parameters were proposed in the literature, but artifacts can remain in specific situations. The objective of the work is to estimate non-uniformity correction coefficients using random scene images without making assumptions about motion or constant statistics. We show analytically and experimentally, how to reduce fixed pattern noise using a facet model. The method works best if out-of-focus images are available for calibration. We estimate NUC coefficients experimentally from a set of twelve scene images. The facet model approach can be an alternative for applications where artifacts otherwise would remain.

Paper Details

Date Published: 12 May 2005
PDF: 12 pages
Proc. SPIE 5784, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI, (12 May 2005); doi: 10.1117/12.605766
Show Author Affiliations
Matthias Voigt, Siemens Corporate Research, Inc. (United States)
Martin Zarzycki, Siemens Corporate Research, Inc. (United States)
Dennis H. LeMieux, Siemens Westinghouse Power Corp. (United States)
Visvanathan Ramesh, Siemens Corporate Research, Inc. (United States)

Published in SPIE Proceedings Vol. 5784:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI
Gerald C. Holst, Editor(s)

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