Share Email Print

Proceedings Paper

Synthetic line-of-sight algorithms for hardware-in-the-loop simulations
Author(s): Henri Richard; Alan Lowman; Gary Ballard
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

During the flight of guided submunitions, translation of the missile with respect to the designated aimpoint causes a rotation of the Line-of-Sight (LOS) in inertial space. Large transmit arrays or 5 axis CARCO tables are used to perform True LOS (TLOS) for in-band simulations. Both of these TLOS approaches have cost or fidelity issues for RF seekers. Typically RF Hardware-in-the-Loop (HWIL) simulations of these guided submunitions are mounted on a Three Axes Rotational Flight Simulator (TARFS), which is not capable of translation, and utilize a 2 to 3 seeker beam width transmit array. This necessitates using a Synthetic Line-of-Sight (SLOS) algorithm with the TARFS in order to maintain the proper line-of-sight orientation during all phases of flight which typically includes largely varying LOS motion. This paper presents a simple explanation depicting TLOS and SLOS (TARFS) geometry and the seamless boresight/target SLOS algorithm utilized in AMRDEC's RF4 facility for a test article flight profile. In conclusion this paper will summarize the current state of SLOS algorithms utilized at AMRDEC and challenges and possible solutions envisioned in the near future.

Paper Details

Date Published: 20 May 2005
PDF: 9 pages
Proc. SPIE 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X, (20 May 2005); doi: 10.1117/12.605628
Show Author Affiliations
Henri Richard, Simulation Technologies, Inc. (United States)
Alan Lowman, Simulation Technologies, Inc. (United States)
Gary Ballard, U.S. Army Aviation and Missile Research, Development, and Engineering Command (United States)

Published in SPIE Proceedings Vol. 5785:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
Robert Lee Murrer, Editor(s)

© SPIE. Terms of Use
Back to Top