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Proceedings Paper

Class AB readout cell designed to reduce the noise of a concurrent continuous-time readout architecture for imaging systems
Author(s): Mayra Sarmiento; Jorge Garcia; Fouad Kiamilev; William Lawler
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Paper Abstract

An alternative, class AB configuration of a proven class A readout cell for active/passive imaging systems is presented. Comparison between the two approaches shows that class AB circuit lowers power consumption and reduces noise by a factor of 3 while using nearly equal chip area. On the other hand, class AB has lower bandwidth because it operates at lower bias currents. A 0.5μm CMOS test chip that includes both types of readout circuits has been designed, fabricated and is currently being tested. Simulation results, using readout circuits from this test chip, are used to compare the two configurations.

Paper Details

Date Published: 19 May 2005
PDF: 8 pages
Proc. SPIE 5791, Laser Radar Technology and Applications X, (19 May 2005); doi: 10.1117/12.605485
Show Author Affiliations
Mayra Sarmiento, Univ. of Delaware (United States)
Jorge Garcia, Univ. of Delaware (United States)
Fouad Kiamilev, Univ. of Delaware (United States)
William Lawler, Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 5791:
Laser Radar Technology and Applications X
Gary W. Kamerman, Editor(s)

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