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Proceedings Paper

Nonlinearity measurements of PIN photodiode based ROSA for FTTX applications
Author(s): Xinzhong Wang; Chun He; Yao Li; Andy Zhou; Wei-Shin Tsay
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Paper Abstract

We have designed and fabricated PIN photodiode based ROSA used for FTTX applications. The critical nonlinearity parameters of Inter-modulation Distortion (IMD) were measured by two RF modulated light sources near 1550nm wavelength channels. A cost effective measuring system with narrow pass band filter was set up and some procedures were utilized for determining the low level signals of IMD. Obtained test results were used in real time to guide packaging process to achieve best receiver performance.

Paper Details

Date Published: 25 March 2005
PDF: 10 pages
Proc. SPIE 5729, Optoelectronic Integrated Circuits VII, (25 March 2005); doi: 10.1117/12.605362
Show Author Affiliations
Xinzhong Wang, Alliance Fiber Optic Products, Inc. (United States)
Chun He, Alliance Fiber Optic Products, Inc. (United States)
Yao Li, Alliance Fiber Optic Products, Inc. (United States)
Andy Zhou, Alliance Fiber Optic Products, Inc. (United States)
Wei-Shin Tsay, Alliance Fiber Optic Products, Inc. (United States)


Published in SPIE Proceedings Vol. 5729:
Optoelectronic Integrated Circuits VII
Louay A. Eldada; El-Hang Lee, Editor(s)

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