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Proceedings Paper

High-precision MTF measurement instrument for focal plane arrays with on-chip TDI
Author(s): Harold Gumbel; Sherman L. Golub; Frank W. Adams; Kevin Morimoto; Paul G. Wolford; Robert B. Jones
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Paper Abstract

The development of focal plane arrays with considerable on-chip processing, notably time-delayed integration, imposes new and severe requirements on the instrumentation to establish the modulation transfer function (MTF) of the integrated focal plane array. This paper describes an instrument to obtain the MTF for such arrays with a high level of accuracy. This instrument was built, and associated errors were obtained experimentally. The instrument uses sine-wave amplitude modulation across the spatial frequency spectrum to reach the Nyquist frequency of the focal plane array. Various algorithms to derive the MTF from the experimental data were investigated; the preferred approach is presented.

Paper Details

Date Published: 1 July 1992
PDF: 9 pages
Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); doi: 10.1117/12.60530
Show Author Affiliations
Harold Gumbel, Lockheed Palo Alto Research Lab. (United States)
Sherman L. Golub, Lockheed Palo Alto Research Lab. (United States)
Frank W. Adams, Lockheed Palo Alto Research Lab. (United States)
Kevin Morimoto, Lockheed Palo Alto Research Lab. (United States)
Paul G. Wolford, Lockheed Palo Alto Research Lab. (United States)
Robert B. Jones, Lockheed Palo Alto Research Lab. (United States)


Published in SPIE Proceedings Vol. 1686:
Test and Evaluation of IR Detectors and Arrays II
Forney M. Hoke, Editor(s)

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