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Proceedings Paper

Testing of focal plane arrays at the AEDC
Author(s): Randy A. Nicholson; Kimberly D. Mead; Robert Wayne Smith
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Paper Abstract

A facility was developed at the Arnold Engineering Development Center (AEDC) to provide complete radiometric characterization offocal plane arrays (FPAs). The highly versatile facility provides the capability to test single detectors, detector arrays, and hybrid FPAs. The primary component of the AEDC test facility is the Focal Plane Characterization Chamber (FPCC). The FPCC provides a cryogenic, low-background environment for the test focal plane. Focal plane testing in the FPCC includes flood source testing, during which the array is uniformly irradiated with JR radiation, and spot source testing, during which the target radiation is focused onto a single pixel or group of pixels. For flood source testing, no optical elements are required between the source output aperture and the array. During flood source testing, performance parameters such as power consumption, responsivity, noise equivalent input, dynamic range, radiometric stability, recovery time, and array uniformity can be assessed. Sufficient data are acquired to permit complete parametric characterization of the array. Crosstalk is evaluated during spot source testing. Spectral response testing is performed in a spectral response test station using a three-grating monochromator. Because the chamber can accommodate several types oftesting in a single test installation, a high throughput rate and good economy ofoperation are possible. Data from the focal plane characterization tests can be presented in a wide variety of formats.

Paper Details

Date Published: 1 July 1992
PDF: 11 pages
Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); doi: 10.1117/12.60518
Show Author Affiliations
Randy A. Nicholson, Calspan Corp./AEDC Operations (United States)
Kimberly D. Mead, Calspan Corp./AEDC Operations (United States)
Robert Wayne Smith, Arnold Engineering Development Ctr. (United States)


Published in SPIE Proceedings Vol. 1686:
Test and Evaluation of IR Detectors and Arrays II
Forney M. Hoke, Editor(s)

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