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Proceedings Paper

Structural and optoelectronic properties of sputtered copper (I) chloride
Author(s): Gomathi Natarajan; Lisa O'Reilly; Stephen Daniels; David C. Cameron; Patrick J. McNally; Olabanji Lucas; Alec Reader; Anirban Mitra; Louise Bradley
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Paper Abstract

Copper (I) Chloride is a wide band gap semiconductor with great potential for silicon-based optoelectronics due to the fact that is closely lattice matched with silicon. This work examines the deposition of CuCl thin films by magnetron sputtering on silicon and glass substrates. Film structural and morphological properties are studied with X-ray diffraction and atomic force microscopy. Optical absorbance and luminescence spectra of CuCl thin films are analysed in order to study the excitonic features. The influence of deposition process parameters and post annealing on the film properties are also reported.

Paper Details

Date Published: 3 June 2005
PDF: 6 pages
Proc. SPIE 5825, Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks, (3 June 2005); doi: 10.1117/12.605100
Show Author Affiliations
Gomathi Natarajan, Dublin City Univ. (Ireland)
Lisa O'Reilly, Dublin City Univ. (Ireland)
Stephen Daniels, Dublin City Univ. (Ireland)
David C. Cameron, Lappeenranta Univ. of Technology (Finland)
Patrick J. McNally, Dublin City Univ. (Ireland)
Olabanji Lucas, Dublin City Univ. (Ireland)
Alec Reader, Innos Ltd. (United Kingdom)
Univ. of Southampton (United Kingdom)
Anirban Mitra, Trinity College Dublin (Ireland)
Louise Bradley, Trinity College Dublin (Ireland)


Published in SPIE Proceedings Vol. 5825:
Opto-Ireland 2005: Optoelectronics, Photonic Devices, and Optical Networks
John Gerard McInerney; Harold S. Gamble; Gerald Farrell; David M. Denieffe; Padraig Hughes; R. Alan Moore; Liam Barry, Editor(s)

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