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Proceedings Paper

Cryogenic measurements of Aerojet GaAs n-JFETs
Author(s): John H. Goebel; Theodore T. Weber; Arthur D. Van Rheenen; Leon L. Jostad; Joo-Young Kim; Ben Gable
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Paper Details

Date Published: 1 July 1992
PDF: 17 pages
Proc. SPIE 1684, Infrared Readout Electronics, (1 July 1992); doi: 10.1117/12.60499
Show Author Affiliations
John H. Goebel, NASA Ames Research Ctr. (United States)
Theodore T. Weber, NASA Ames Research Ctr. (United States)
Arthur D. Van Rheenen, Univ. of Minnesota (United States)
Leon L. Jostad, Aerojet Corp. (United States)
Joo-Young Kim, Aerojet Corp. (United States)
Ben Gable, Aerojet Corp. (United States)

Published in SPIE Proceedings Vol. 1684:
Infrared Readout Electronics
Eric R. Fossum, Editor(s)

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