Share Email Print

Proceedings Paper

Noise and current-voltage characterization of complementary heterojunction field-effect transistor structures below 8 K
Author(s): Thomas J. Cunningham; Eric R. Fossum; Steven M. Baier
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published: 1 July 1992
PDF: 9 pages
Proc. SPIE 1684, Infrared Readout Electronics, (1 July 1992); doi: 10.1117/12.60498
Show Author Affiliations
Thomas J. Cunningham, Jet Propulsion Lab. (United States)
Eric R. Fossum, Jet Propulsion Lab. (United States)
Steven M. Baier, Honeywell Systems and Research Ctr. (United States)

Published in SPIE Proceedings Vol. 1684:
Infrared Readout Electronics
Eric R. Fossum, Editor(s)

© SPIE. Terms of Use
Back to Top