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Proceedings Paper

Microwave-modulated photoluminescence: technique and application to III-Vs (Poster Paper)
Author(s): Matthew C. DeLong; I. Viohl; W. D. Ohlsen; P. Craig Taylor; Ferdynand P. Dabkowski; Kathleen Meehan; Jeannie E. Williams; Mark Hopkinson
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Paper Abstract

A new modulation spectroscopy, microwave modulated photoluminescence (MMPL), is described. Application of the technique to a well characterized semiconductor system, InP:Zn, in which the radiative recombination processes are not understood, allows interpretation of the resulting spectra. In the ordered ternary Ga0.52In0.48P MMPL provides information about both carrier transport properties and the extent of ordering. When applied to new materials, MMPL can aid identifying radiative recombination processes.

Paper Details

Date Published: 1 July 1992
PDF: 9 pages
Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992); doi: 10.1117/12.60468
Show Author Affiliations
Matthew C. DeLong, Univ. of Utah (United States)
I. Viohl, Univ. of Utah (United States)
W. D. Ohlsen, Univ. of Utah (United States)
P. Craig Taylor, Univ. of Utah (United States)
Ferdynand P. Dabkowski, Polaroid Corp. (United States)
Kathleen Meehan, Polaroid Corp. (United States)
Jeannie E. Williams, Polaroid Corp. (United States)
Mark Hopkinson, Univ. of Sheffield (United Kingdom)

Published in SPIE Proceedings Vol. 1678:
Spectroscopic Characterization Techniques for Semiconductor Technology IV
Orest J. Glembocki, Editor(s)

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