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Proceedings Paper

Spectral identity mapping for enhanced chemical image analysis
Author(s): John F. Turner
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Paper Abstract

Advances in spectral imaging instrumentation during the last two decades has lead to higher image fidelity, tighter spatial resolution, narrower spectral resolution, and improved signal to noise ratios. An important sub-classification of spectral imaging is chemical imaging, in which the sought-after information from the sample is its chemical composition. Consequently, chemical imaging can be thought of as a two-step process, spectral image acquisition and the subsequent processing of the spectral image data to generate chemically relevant image contrast. While chemical imaging systems that provide turnkey data acquisition are increasingly widespread, better strategies to analyze the vast datasets they produce are needed. The Generation of chemically relevant image contrast from spectral image data requires multivariate processing algorithms that can categorize spectra according to shape. Conventional chemometric techniques like inverse least squares, classical least squares, multiple linear regression, principle component regression, and multivariate curve resolution are effective for predicting the chemical composition of samples having known constituents, but are less effective when a priori information about the sample is unavailable. To address these problems, we have developed a fully automated non-parametric technique called spectral identity mapping (SIMS) that reduces the dependence of spectral image analysis on training datasets. The qualitative SIMS method provides enhanced spectral shape specificity and improved chemical image contrast. We present SIMS results of infrared spectral image data acquired from polymer coated paper substrates used in the manufacture of pressure sensitive adhesive tapes. In addition, we compare the SIMS results to results from spectral angle mapping (SAM) and cosine correlation analysis (CCA), two closely related techniques.

Paper Details

Date Published: 23 March 2005
PDF: 9 pages
Proc. SPIE 5694, Spectral Imaging: Instrumentation, Applications, and Analysis III, (23 March 2005); doi: 10.1117/12.604546
Show Author Affiliations
John F. Turner, Cleveland State Univ. (United States)


Published in SPIE Proceedings Vol. 5694:
Spectral Imaging: Instrumentation, Applications, and Analysis III
Gregory H. Bearman; Anita Mahadevan-Jansen; Richard M. Levenson, Editor(s)

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