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Proceedings Paper

Photoluminescence from pseudomorphically strained Si/Si1-xGex multiple quantum wells grown on silicon
Author(s): Stefan Zollner; Reuben T. Collins; Mark S. Goorsky; P. J. Wang; M. J. Tejwani; J. O. Chu; Bernard S. Meyerson; F. K. LeGoues
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Paper Details

Date Published: 1 July 1992
PDF: 8 pages
Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992); doi: 10.1117/12.60443
Show Author Affiliations
Stefan Zollner, IBM Thomas J. Watson Research Ctr. (United States)
Reuben T. Collins, IBM Thomas J. Watson Research Ctr. (United States)
Mark S. Goorsky, IBM Thomas J. Watson Research Ctr. (United States)
P. J. Wang, IBM Thomas J. Watson Research Ctr. (United States)
M. J. Tejwani, IBM Thomas J. Watson Research Ctr. (United States)
J. O. Chu, IBM Thomas J. Watson Research Ctr. (United States)
Bernard S. Meyerson, IBM Thomas J. Watson Research Ctr. (United States)
F. K. LeGoues, IBM Thomas J. Watson Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1678:
Spectroscopic Characterization Techniques for Semiconductor Technology IV

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