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Proceedings Paper

Optical studies of interface roughness in GaAs/AlAs quantum-well structures (Invited Paper)
Author(s): Daniel G. Gammon; Benjamin V. Shanabrook; D. Scott Katzer
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Paper Details

Date Published: 1 July 1992
PDF: 10 pages
Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992); doi: 10.1117/12.60441
Show Author Affiliations
Daniel G. Gammon, Naval Research Lab. (United States)
Benjamin V. Shanabrook, Naval Research Lab. (United States)
D. Scott Katzer, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 1678:
Spectroscopic Characterization Techniques for Semiconductor Technology IV

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