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Proceedings Paper

High-resolution x-ray diffraction analysis of thin III-V layers and quantum wires (Invited Paper)
Author(s): Leander Tapfer
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Paper Details

Date Published: 1 July 1992
PDF: 13 pages
Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992); doi: 10.1117/12.60437
Show Author Affiliations
Leander Tapfer, Centro Nazionale Ricerca e Sviluppo Materiali (Italy)


Published in SPIE Proceedings Vol. 1678:
Spectroscopic Characterization Techniques for Semiconductor Technology IV

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