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Proceedings Paper

Calculation of electron-optical characteristics for Gen I image intensifiers under the deflection and gating regime
Author(s): Sergey V. Kolesnikov
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Paper Abstract

An efficient method for calculating electron-optical characteristics of electrostatic electron- optical systems (EOS) for focusing and deflection (gating) in image intensifiers is proposed. Dwelling on this method based on perturbation theory (which in electron optics is usually called the aberration theory) the paper presents EOS characteristics estimated using software support for the relevant computer-aided design (CAD) system. Some examples of CAD of different EOS constructive implementations are provided.

Paper Details

Date Published: 1 June 1992
PDF: 8 pages
Proc. SPIE 1655, Electron Tubes and Image Intensifiers, (1 June 1992); doi: 10.1117/12.60325
Show Author Affiliations
Sergey V. Kolesnikov, Radian (Russia)


Published in SPIE Proceedings Vol. 1655:
Electron Tubes and Image Intensifiers
C. Bruce Johnson; Bruce N. Laprade, Editor(s)

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