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Proceedings Paper

Measurement of thermal time constant of microbolometer arrays
Author(s): A. J. Syllaios; Miranda J. Ha; William L. McCardel; Thomas R. Schimert
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Paper Abstract

A method is described for the direct measurement of the thermal time constant of microbolometer arrays: The emitted radiation from an array due to time varying Joule heating is monitored by a fast photodetector. Applying a bias voltage pulse to the array the thermal time constant is measured from the time dependence of the emission decay at the end of the pulse. In particular, we have used HgCdTe photodetector and digital signal acquisition and analysis to measure the thermal time constant of uncooled a-Si:H microbolometer 120 x 160 arrays with 50 micron pixels. Measured typical thermal time constant values for such arrays are in the range of 8ms to 10ms.

Paper Details

Date Published: 31 May 2005
PDF: 6 pages
Proc. SPIE 5783, Infrared Technology and Applications XXXI, (31 May 2005); doi: 10.1117/12.603153
Show Author Affiliations
A. J. Syllaios, L-3 Communications Infrared Products (United States)
Miranda J. Ha, L-3 Communications Infrared Products (United States)
William L. McCardel, L-3 Communications Infrared Products (United States)
Thomas R. Schimert, L-3 Communications Infrared Products (United States)


Published in SPIE Proceedings Vol. 5783:
Infrared Technology and Applications XXXI
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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