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Proceedings Paper

Modeling of Er in ceramic YAG and comparison with single-crystal YAG
Author(s): Bahram Zandi; John B. Gruber; Dhiraj K. Sardar; Toomas H. Allik
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Paper Abstract

Recent advances in the growth of rare earths doped into ceramic (poly-crystalline) materials have generated considerable interest for the next generation of tactical laser systems mainly because ceramics provide larger size, greater strength and lower cost factors in design than their single-crystalline counterparts. For many years, Nd:YAG has been the laser material choice for stability and high power Er has been an ion laser source of interest for defense due to its eye-safe emission at 1.5 μm and has applications in infrared counter-measures, illumination detection, remote sensing and communication technologies. A model Hamiltonian including atomic and crystal-field terms is diagonalized within the complete 4f11 SLJMJ basis set which includes 364 states. Within the standard deviation obtained between 117 comparable calculated-to-observed Stark levels, one set of atomic and crystal-field parameters describes the splitting of the Nd3+ and Er3+ energy levels in either the ceramic or single-crystal host. We report a detailed crystal-field splitting analysis for a number of multiplet manifolds of Nd3+ and Er3+ in both the ceramic and single-crystal form of YAG (Y3Al5O12). With few exceptions, analysis shows that the energy-level structure of Nd3+ and Er3+ is similar in the ceramic and single-crystal laser rods.

Paper Details

Date Published: 1 June 2005
PDF: 8 pages
Proc. SPIE 5792, Laser Source and System Technology for Defense and Security, (1 June 2005); doi: 10.1117/12.602938
Show Author Affiliations
Bahram Zandi, ARL/Adelphi Lab. Ctr. (United States)
John B. Gruber, San Jose State Univ. (United States)
Dhiraj K. Sardar, Univ. of Texas at San Antonio (United States)
Toomas H. Allik, Science Applications International Corp. (United States)

Published in SPIE Proceedings Vol. 5792:
Laser Source and System Technology for Defense and Security
Gary L. Wood, Editor(s)

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