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Proceedings Paper

Sensor management for landmine detection
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Paper Abstract

A method known as active sensing is applied to the problem of landmine detection. The platform utilizes two scanning sensor arrays composed of ground penetrating radar (GPR) and electromagnetic induction (EMI) metal detectors. Six simulated confirmation sensors are then dynamically deployed according to their ability to enhance information gain. Objects of interest are divided into ten class types: three classes are for metal landmines, three classes for plastic landmines, three classes for clutter objects, and one final class for background clutter. During the initial scan mode, a uniform probability is assumed for the ten classes. The scanning measurement assigns an updated probability based on the observations of the scanning sensors. At this point a confirmation sensor is chosen to re-interrogate the object. The confirmation sensor used is the one expected to produce the maximum information gain. A measure of entropy called the Renyi divergence is applied to the class probabilities to predict the information gain for each sensor. A time monitoring extension to the approach keeps track of time, and chooses the confirmation sensor based on a combination of maximum information gain and fastest processing time. Confusion matrices are presented for the scanning sensors showing the initial classification capability. Subsequent confusion matrices show the classification performance after applying active sensing myopically and with the time monitoring extension.

Paper Details

Date Published: 10 June 2005
PDF: 12 pages
Proc. SPIE 5794, Detection and Remediation Technologies for Mines and Minelike Targets X, (10 June 2005); doi: 10.1117/12.602756
Show Author Affiliations
Jay A. Marble, Univ. of Michigan (United States)
Alfred O. Hero, Univ. of Michigan (United States)
Andrew E. Yagle, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 5794:
Detection and Remediation Technologies for Mines and Minelike Targets X
Russell S. Harmon; J. Thomas Broach; John H. Holloway Jr., Editor(s)

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