Share Email Print
cover

Proceedings Paper

Sensor modules for structural health monitoring and reliability of components
Author(s): Michael Kroening; Axel Berthold; Norbert Meyendorf
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Safety and availability of ageing infrastructures require periodic or continuous monitoring of the structure’s integrity. Innovative design criteria for new infrastructure components may allow material and energy conservation if components are continuously monitored by using advanced sensor systems. This concept for recurring Structural Health Monitoring will replace a significant part of conventional NDE by new maintenance concepts. The goal consists in sensor networks based on advanced principles of testing technology with integrated signal/data processing and data communication. NDE modeling is required for the quantification of measurement results. Finally, a decision on the integrity of the structure based on sensor results requires detailed knowledge about material behavior and modeling capacity for materials and components. IZFP has developed sensor concepts for complex solutions applicable to Structural Health Monitoring for different applications. These applications include railroad inspection, aircraft inspection, inspection of wind energy systems, power electric switches and micro gas valves. Basic concepts and applications of sensor networks will be presented.

Paper Details

Date Published: 9 May 2005
PDF: 3 pages
Proc. SPIE 5770, Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring, (9 May 2005); doi: 10.1117/12.602316
Show Author Affiliations
Michael Kroening, Fraunhofer Institute for Non-Destructive Testing (Germany)
Axel Berthold, Fraunhofer Institute for Non-Destructive Testing (Germany)
Norbert Meyendorf, Fraunhofer Institute for Non-Destructive Testing (Germany)


Published in SPIE Proceedings Vol. 5770:
Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

© SPIE. Terms of Use
Back to Top