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Proceedings Paper

X-ray diffraction topography image materials by molecular probe
Author(s): Manfred P. Hentschel; Axel Lange; Joerg Schors; Oliver Wald
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Paper Abstract

Crystallinity, composition, homogeneity and anisotropy determine the mechanical properties of materials significantly, but the performance of most non-destructive techniques is too poor for measuring these micro structures as they are optimized for finding individual flaws/defects. X-ray (wide angle) Diffraction Topography by single beam scanning images molecular information at a spatial resolution of several ten micrometers even in three dimensions. Especially for the non-destructive characterization of composite materials, they provide additional capabilities by crystallographic contrast by the molecular/atomic probe. The different material phases of compounds and their molecular orientation can be imaged e.g. fibers or polymer chain orientation in composites: A sample is scanned or rotated, while only part of the scattering pattern is pointing at an X-ray detector area. Three different methods have been developed: i) planar X-ray Scanning Topography at one or more pre-selected scattering angles provides high contrast of different phases of components. ii) X-Ray Rotation Topography reveals the texture angle of composite fibers and chain polymers. iii) X-ray Diffraction Microscopy images the texture and phase distribution of transversal sections of the material. The principles of Wide Angle X-Ray Diffraction Topography are explained and examples of investigations will be presented. They combine the advantages of radiographic imaging and crystal structure information. The applied X-ray energies are much lower than in NDT radiography, which recommends preferably the application to light weight materials.

Paper Details

Date Published: 9 May 2005
PDF: 6 pages
Proc. SPIE 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III, (9 May 2005); doi: 10.1117/12.601886
Show Author Affiliations
Manfred P. Hentschel, Federal Institute for Materials Research and Testing (Germany)
Axel Lange, Federal Institute for Materials Research and Testing (Germany)
Joerg Schors, Federal Institute for Materials Research and Testing (Germany)
Oliver Wald, Federal Institute for Materials Research and Testing (Germany)


Published in SPIE Proceedings Vol. 5766:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
Robert E. Geer; Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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