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Proceedings Paper

Spectral-band engineering with interacting resonant leaky modes in thin periodic films
Author(s): R. Magnusson; Y. Ding
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Paper Abstract

This paper addresses guided-mode resonance elements with binary profiles and their spectral and physical properties. It is shown that these subwavelength periodic waveguide films yield rich spectra that are critically influenced by the shape of the grating profile. The symmetry of the profile controls the resonance spectral density. Symmetric profiles generate a single resonance on either side of the second stopband whereas two resonances arise, one on each side of the band, for asymmetric structures. The profile's Fourier harmonic content, along with the absolute value of the grating modulation strength, affects the resonance linewidths and their relative locations. Computed Brillouin diagrams illustrate key properties of the resonant leaky-mode spectra in relation to modulation strength and profile symmetry at the second stopband. Associated mode plots elucidate the spatial distribution of the leaky-mode field amplitude at resonance and show that at higher modulation, the shape appears as a complex mixture of modes. The results presented include wavelength and angular spectra for several example devices including narrowband transmission filter, wideband reflectors and transmission elements for TE and TM polarization, and a wideband polarizer. Effects of fabrication errors are considered for the polarizing device and an example of a fabricated narrow-band reflector is provided. These results demonstrate new dimensions in optical device design and may provide complementary capability with the field of thin-film optics.

Paper Details

Date Published: 22 January 2005
PDF: 11 pages
Proc. SPIE 5720, Micromachining Technology for Micro-Optics and Nano-Optics III, (22 January 2005); doi: 10.1117/12.601191
Show Author Affiliations
R. Magnusson, Univ. of Connecticut (United States)
Y. Ding, Univ. of Connecticut (United States)


Published in SPIE Proceedings Vol. 5720:
Micromachining Technology for Micro-Optics and Nano-Optics III
Eric G. Johnson; Gregory P. Nordin; Thomas J. Suleski, Editor(s)

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