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Proceedings Paper

Photothermal measurement of thermal conductivity of optical coatings
Author(s): Zhouling Wu; Michael Reichling; H. Gronbeck; Zhengxiu Fan; Dieter Schaefer; Eckart Matthias
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Paper Abstract

In this paper we report our recent measurements of thermal conductivities of optical coatings by two photothermal methods, namely photothermal reflectance and photothermal deformation technique. We will first give a brief introduction of the principles and the apparatus for the experiments, and then present the measured thermal conductivities of various coatings including oxide layers (SiO2, ZrO2, Ta2O5) on BK7 glass, a MgF2 film on MgF2 substrate and metallic films (Au). The results are compared between the two methods as well as with those previously reported by other techniques and those of the related bulk materials.

Paper Details

Date Published: 29 July 1992
PDF: 15 pages
Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); doi: 10.1117/12.60117
Show Author Affiliations
Zhouling Wu, Freie Univ. Berlin (United States)
Michael Reichling, Freie Univ. Berlin (Germany)
H. Gronbeck, Freie Univ. Berlin (Sweden)
Zhengxiu Fan, Shanghai Institute of Optics and Fine Mechanics (China)
Dieter Schaefer, Zentralinstitut fuer Optik und Spektroskopie (Germany)
Eckart Matthias, Freie Univ. Berlin (Germany)

Published in SPIE Proceedings Vol. 1624:
Laser-Induced Damage in Optical Materials: 1991
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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