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High damage threshold mirrors and polarizers in the ZrO2/SiO2 and HfO2/SiO2 dielectric systems
Author(s): Carine Fournet; B. Pinot; Bernard Geenen; Francis Ollivier; W. Alexandre; Herve G. Floch; Andre Roussel; C. Cordillot; Danielle Billon
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Paper Details

Date Published: 29 July 1992
PDF: 12 pages
Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); doi: 10.1117/12.60095
Show Author Affiliations
Carine Fournet, MATRA DET/DTO (France)
B. Pinot, MATRA DET/DTO (France)
Bernard Geenen, MATRA DET/DTO (France)
Francis Ollivier, MATRA DET/DTO (France)
W. Alexandre, MATRA DET/DTO (France)
Herve G. Floch, Ctr. d'Etudes de Limeil Valenton (France)
Andre Roussel, Ctr. d'Etudes de Limeil Valenton (France)
C. Cordillot, Ctr. d'Etudes de Limeil Valenton (France)
Danielle Billon, Ctr. d'Etudes de Limeil Valenton (France)


Published in SPIE Proceedings Vol. 1624:
Laser-Induced Damage in Optical Materials: 1991
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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